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 SPW17N80C3 Cool MOSTM Power Transistor
Feature * New revolutionary high voltage technology * Worldwide best RDS(on) in TO 247 * Ultra low gate charge * Periodic avalanche rated * Extreme dv/dt rated
VDS RDS(on) ID
800 0.29 17
P-TO247
V A
Type SPW17N80C3
Package P-TO247
Ordering Code Q67040-S4359
Marking 17N80C3
Maximum Ratings Parameter Symbol ID Value Unit
Continuous drain current
TC = 25 C TC = 100 C
A 17 11
Pulsed drain current, tp limited by Tjmax Avalanche energy, single pulse
I D = 3.4 A, VDD = 50 V
I D puls EAS
51 670 0.5 17 20
30
mJ
Avalanche energy, repetitive tAR limited by Tjmax1) EAR
I D = 17 A, VDD = 50 V
Avalanche current, repetitive tAR limited by Tjmax I AR Gate source voltage VGS Gate source voltage AC (f >1Hz)
Power dissipation, T C = 25C
A V W C
VGS Ptot T j , T stg
208 -55... +150
Operating and storage temperature
Rev. 2.1
Page 1
2004-03-03
SPW17N80C3
Maximum Ratings Parameter Drain Source voltage slope
V DS = 640 V, ID = 17 A, Tj = 125 C
Symbol dv/dt
Value 50
Unit V/ns
Thermal Characteristics Parameter Thermal resistance, junction - case Thermal resistance, junction - ambient, leaded Soldering temperature, 1.6 mm (0.063 in.) from case for 10s Symbol min. RthJC RthJA Values typ. max. 0.6 62 260 C K/W Unit
Tsold
Electrical Characteristics, at Tj=25C unless otherwise specified Parameter Symbol Conditions min. Drain-source breakdown voltage V(BR)DSS VGS=0V, ID=0.25mA Drain-Source avalanche breakdown voltage Gate threshold voltage Zero gate voltage drain current VGS(th) IDSS
ID=1000, VGS=VDS VDS=800V, VGS=0V, Tj=25C, Tj=150C
Values typ. 870 3 0.5 0.25 0.78 0.7 max. 3.9 800 2.1 -
Unit V
V(BR)DS VGS=0V, ID=17A
A 25 250 100 0.29 nA
Gate-source leakage current
IGSS
VGS=20V, VDS=0V VGS=10V, ID=11A, Tj=25C Tj=150C
Drain-source on-state resistance RDS(on)
Gate input resistance
RG
f=1MHz, open Drain
Rev. 2.1
Page 2
2004-03-03
SPW17N80C3
Electrical Characteristics , at Tj = 25 C, unless otherwise specified Parameter
Transconductance Input capacitance Output capacitance Reverse transfer capacitance
Symbol g fs Ciss Coss Crss
Conditions min.
V DS2*I D*RDS(on)max,
ID=11A
Values typ. 15 2320 1250 60 59 124 25 15 72 6 max. 82 9 -
Unit S pF
V GS=0V, V DS=25V, f=1MHz
Effective output capacitance, 2) Co(er) energy related Effective output capacitance, 3) Co(tr) time related
Turn-on delay time Rise time Turn-off delay time Fall time
V GS=0V, V DS=0V to 480V
pF
td(on) tr td(off) tf
V DD=400V, V GS=0/10V,
ID=17A, RG =4.7,
-
ns
Tj=125C
Gate Charge Characteristics Gate to source charge Qgs Gate to drain charge Gate charge total Gate plateau voltage Qgd Qg
VDD=640V, ID=17A
-
12 46 91 6
177 -
nC
VDD=640V, ID=17A, VGS=0 to 10V
V(plateau) VDD=640V, ID=17A
V
1Repetitve avalanche causes additional power losses that can be calculated as P =EAR*f. AV 2C o(er) is a fixed capacitance that gives the same stored energy as Coss while VDS is rising from 0 to 80% V DSS. 3C o(tr) is a fixed capacitance that gives the same charging time as Coss while V DS is rising from 0 to 80% V DSS.
Rev. 2.1
Page 3
2004-03-03
SPW17N80C3
Electrical Characteristics, at Tj = 25 C, unless otherwise specified Parameter Inverse diode continuous forward current Inverse diode direct current, pulsed Inverse diode forward voltage Reverse recovery time Reverse recovery charge Peak reverse recovery current Peak rate of fall of reverse recovery current VSD trr Qrr Irrm dirr /dt
VGS=0V, IF=IS VR=400V, IF=IS , diF/dt=100A/s
Symbol IS ISM
Conditions min.
TC=25C
Values typ. 1 550 15 51 1200 max. 17 51 1.2 -
Unit A
V ns C A A/s
Typical Transient Thermal Characteristics Symbol
Thermal resistance R th1 R th2 R th3 R th4 R th5 R th6 0.00812 0.016 0.031 0.114 0.135 0.059 K/W
Value typ.
Unit
Symbol
Value typ.
Unit
Thermal capacitance Cth1 Cth2 Cth3 Cth4 Cth5 Cth6 0.0003562 0.001337 0.001831 0.005033 0.012 0.092 Ws/K
Tj P tot (t)
R th1
R th,n
T case
E xternal H eatsink
C th1
C th2
C th,n T am b
Rev. 2.1
Page 4
2004-03-03
SPW17N80C3
1 Power dissipation
Ptot = f (TC)
240
SPW17N80C3
2 Safe operating area
ID = f ( V DS ) parameter : D = 0 , T C=25C
10 2
W
200 180
A
10 1
Ptot
140 120 100 80 60 40 20 0 0 20 40 60 80 100 120 10 -1 10 0
ID
160
tp = 0.001 ms tp = 0.01 ms tp = 0.1 ms tp = 1 ms DC
C
160
10 -2 0 10
10
1
10
2
TC
10 V VDS
3
3 Transient thermal impedance
ZthJC = f (t p) parameter: D = tp/T
10
1
4 Typ. output characteristic
ID = f (VDS); Tj=25C parameter: tp = 10 s, VGS
A
70
K/W
10 0
60 55 50
20V 10V
ZthJC
ID
10 -1
45 40 35
8V 7V
10 -2
10 -3
D = 0.5 D = 0.2 D = 0.1 D = 0.05 D = 0.02 D = 0.01 single pulse
30 25 20 15 10 5
5V 6V
10 -4 -7 10
10
-6
10
-5
10
-4
10
-3
s tp
10
-1
0 0
5
10
15
20
VDS
30
V
Rev. 2.1
Page 5
2004-03-03
SPW17N80C3
5 Typ. output characteristic
ID = f (VDS); Tj=150C parameter: tp = 10 s, VGS
35
6 Typ. drain-source on resistance
RDS(on)=f(ID) parameter: Tj=150C, V GS
1.5
A
20V 10V 8V 7V
6.5V 6V
1.3
25
RDS(on)
1.2 1.1 1 0.9
4V 4.5V 5V 5.5V 6V 6.5V
ID
20
5.5V
15
5V
10
0.8 0.7 0.6 0.5 0
4.5V
5
7V 8V 10V 20V
4V
0 0
5
10
15
20
VDS
30
5
10
15
20
25
A ID
35
V
7 Drain-source on-state resistance
RDS(on) = f (Tj) parameter : ID = 11 A, VGS = 10 V
1.6
SPW17N80C3
8 Typ. transfer characteristics
ID= f ( VGS ); V DS 2 x ID x RDS(on)max parameter: tp = 10 s
65
A
55
25C
1.2 50 45 1
RDS(on)
ID
40 35
150C
0.8
30 25 20
0.6
0.4
98% typ
15 10 5
0.2
0 -60
-20
20
60
100
C
180
0 0
2
4
6
8
10
12
14
16
Tj
V 20 VGS
Rev. 2.1
Page 6
2004-03-03
SPW17N80C3
9 Typ. gate charge
VGS = f (QGate)
10 Forward characteristics of body diode
IF = f (VSD) parameter: Tj , tp = 10 s
10 2
SPW17N80C3
parameter: ID = 17 A pulsed
16
V
SPW17N80C3
A
12
0.2 VDS max
VGS
10 1
8
6
IF
10 0 Tj = 25 C typ Tj = 150 C typ Tj = 25 C (98%) Tj = 150 C (98%)
nC
10 0.8 VDS max
4
2 10 -1 0
0 0
20
40
60
80
100
120
160
0.4
0.8
1.2
1.6
2
2.4 V
3
QGate
VSD
11 Avalanche SOA
IAR = f (tAR) par.: Tj 150 C
18
12 Avalanche energy
EAS = f (Tj) par.: ID = 3.4 A, V DD = 50 V
mJ
700
A
600 14 12 10 8 6
Tj (START)=25C
550 500
EAS
Tj (START)=125C
IAR
450 400 350 300 250 200 150 100 50
4 2 0 -3 10
10
-2
10
-1
10
0
10
1
10
2
s 10 tAR
4
0 25
50
75
100
C Tj
150
Rev. 2.1
Page 7
2004-03-03
SPW17N80C3
13 Drain-source breakdown voltage
V(BR)DSS = f (Tj)
980
SPW17N80C3
14 Avalanche power losses
PAR = f (f ) parameter: E AR=0.5mJ
500
V
940
W
400 350 300 250 200 150 100 50 04 10
5 6
V(BR)DSS
920
880 860 840 820 800 780 760 740 720 -60 -20 20 60 100
C
PAR
900
180
10
Hz f
10
Tj
15 Typ. capacitances
C = f (VDS) parameter: V GS=0V, f=1 MHz
10 5
16 Typ. Coss stored energy
Eoss=f(VDS)
18
pF
10 4
Ciss
J
14
Eoss
Coss Crss
12 10 8 6
10 3
C
10 2
10 1
4 2
10 0 0
100
200
300
400
500
600
V 800 VDS
0 0
100
200
300
400
500
600
V 800 VDS
Rev. 2.1
Page 8
2004-03-03
SPW17N80C3
Definition of diodes switching characteristics
Rev. 2.1
Page 9
2004-03-03
SPW17N80C3
P-TO-247-3-1
15.9 6.35 o3.61 5.03 2.03
4.37
20.9
9.91
6.17
D
7
D
1.75
1.14 0.243 1.2 2 2.92 5.46
16
0.762 MAX. 2.4 +0.05
General tolerance unless otherwise specified: Leadframe parts: 0.05 Package parts: 0.12
Rev. 2.1
41.22
2.97 x 0.127
5
5.94
20
Page 10
2004-03-03
SPW17N80C3
Published by Infineon Technologies AG, Bereichs Kommunikation St.-Martin-Strasse 53, D-81541 Munchen (c) Infineon Technologies AG 1999 All Rights Reserved. Attention please! The information herein is given to describe certain components and shall not be considered as warranted characteristics. Terms of delivery and rights to technical change reserved. We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. Infineon Technologies is an approved CECC manufacturer. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office in Germany or our Infineon Technologies Reprensatives worldwide (see address list). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 2.1
Page 11
2004-03-03


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